variable pressure scanning electron microscope (vp-sem) ep evo 50 Search Results


scanning electron microscope sem  (Hitachi Ltd)
99
Hitachi Ltd scanning electron microscope sem
Scanning Electron Microscope Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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high vacuum scanning electron microscope (vp-sem; su3550  (Hitachi Ltd)
90
Hitachi Ltd high vacuum scanning electron microscope (vp-sem; su3550
High Vacuum Scanning Electron Microscope (Vp Sem; Su3550, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/high vacuum scanning electron microscope (vp-sem; su3550/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
high vacuum scanning electron microscope (vp-sem; su3550 - by Bioz Stars, 2026-04
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variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-04
90/100 stars
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carl supra 55 vp sem instrument  (Carl Zeiss)
90
Carl Zeiss carl supra 55 vp sem instrument
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Carl Supra 55 Vp Sem Instrument, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/carl supra 55 vp sem instrument/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
carl supra 55 vp sem instrument - by Bioz Stars, 2026-04
90/100 stars
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variable pressure scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope - by Bioz Stars, 2026-04
90/100 stars
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scanning electron microscope (sem) s-3000n vpsem  (Hitachi Ltd)
90
Hitachi Ltd scanning electron microscope (sem) s-3000n vpsem
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Scanning Electron Microscope (Sem) S 3000n Vpsem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/scanning electron microscope (sem) s-3000n vpsem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
scanning electron microscope (sem) s-3000n vpsem - by Bioz Stars, 2026-04
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su3500 premium vp-sem scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd su3500 premium vp-sem scanning electron microscope
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Su3500 Premium Vp Sem Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
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scanning electron microscopy vpsem leo 1450vp  (Carl Zeiss)
90
Carl Zeiss scanning electron microscopy vpsem leo 1450vp
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Scanning Electron Microscopy Vpsem Leo 1450vp, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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quanta 200 esem/vpsem environmental scanning electron microscope  (Thermo Fisher)
90
Thermo Fisher quanta 200 esem/vpsem environmental scanning electron microscope
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Quanta 200 Esem/Vpsem Environmental Scanning Electron Microscope, supplied by Thermo Fisher, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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environmental scanning electron microscope esem/vp–sem–jeol it-300  (JEOL)
90
JEOL environmental scanning electron microscope esem/vp–sem–jeol it-300
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Environmental Scanning Electron Microscope Esem/Vp–Sem–Jeol It 300, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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merlin vp sem/scanning transmission electron microscope  (Carl Zeiss)
90
Carl Zeiss merlin vp sem/scanning transmission electron microscope
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Merlin Vp Sem/Scanning Transmission Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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flexsem 1000 vpsem  (Hitachi Ltd)
90
Hitachi Ltd flexsem 1000 vpsem
Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the <t>SEM</t> images in two different magnifications, and ( c ) <t>the</t> <t>EDS</t> mapping mode and the EDS spectrum.
Flexsem 1000 Vpsem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Journal: Plants

Article Title: Antioxidant Responses of Phenolic Compounds and Immobilization of Copper in Imperata cylindrica , a Plant with Potential Use for Bioremediation of Cu Contaminated Environments

doi: 10.3390/plants9101397

Figure Lengend Snippet: Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Article Snippet: In order to localize the Cu-bound to the shoot and root tissues, plants with 21 days of growth were observed by Variable Pressure Scanning Electron Microscope (VP-SEM), with transmission module STEM SU-3500 (Hitachi, Tokyo, Japan).

Techniques: Electron Microscopy

Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the SEM images in two different magnifications, and ( c ) the EDS mapping mode and the EDS spectrum.

Journal: Materials

Article Title: Optimization of the Mechanical Properties and the Cytocompatibility for the PMMA Nanocomposites Reinforced with the Hydroxyapatite Nanofibers and the Magnesium Phosphate Nanosheets

doi: 10.3390/ma14195893

Figure Lengend Snippet: Characterization of the PMMA-MgP-HA nanocomposites: ( a ) schematic diagram for the formation of nanocomposite, ( b ) the SEM images in two different magnifications, and ( c ) the EDS mapping mode and the EDS spectrum.

Article Snippet: Scanning electron microscope (SEM) (Hitachi S-3000N VPSEM) equipped with energy-dispersive X-ray spectroscopy (EDS) and field emission scanning electron microscope (FESEM) (JEOL JSM-6320F) were used to investigate surface morphology and elemental compositions.

Techniques: